Hello,
Query from a customer who noticed changes to wire bonding processes/wafer on TI part TPS2012AD noted around 2005 DCs. I found that the data sheet posted was revised in 2007, but don’t know what the parametrics were like before this change, so I have nothing to compare to. Requester notes that individual fabricators had issued PCN/PDN during this time with adjustments. I only see that on the notes on the bottom of pages 26-31 of the data sheet, it mentions that some metrics come down to individual fabricators, but I don’t believe that’s enough to substantiate a difference in the process.
Can you advise what changes were made in the revision of the data sheet in 2007 and if any of those were related to the wire bonding process on this part or the die map?
Thank you