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BQ25300: Short test data

Satoshi
Guru 19655 points
Part Number: BQ25300


Is there short test data for bq25300 on below condition?

・Adjacent pin to pin short

・SW to GND short

・BAT to GND short

Best regards,

Satoshi

  • 0
    TI__Guru**** 169756 points

    HI Satoshi,

    I do not have a customer friendly report available.  There are protections to prevent damage from SW and BAT being shorted to GND.  The only pin to pin shorts that result in IC damage are BTST to GND (thermal pad) and PMID to BTST.

    Regards,

    Jeff

  • 0 in reply to Jeff F
    Guru 19655 points

    Hi Jeff

    Thank you for reply,

    Please let me know about additional question and request below;

    ・Is there any test waveform for short circuit protection the other than figure 10-6? 

    　Customer want to reference the these test data as much as possible.

    ・If in the case of BTST pin ~ PMID pin short, or BTST pin ~ GND short, is this possibility to cause battery overload?

    　Or, is it occur only IC damage?

    Best regards,

    Satoshi

  • +1 in reply to Satoshi
    TI__Guru**** 169756 points

    Hi Satoshi,

    I have requested e2e friendship so we can chat privately about this

    Regarding the BTST shorts causing damage, the IC was damaged but the FETs failed to an open so not battery damage.

    Regards,

    Jeff