Other Parts Discussed in Thread: BQSTUDIO, EV2400
Hi TI team,
We are testing protection functionality on BQ76952. A gate driver is being used to drive low side FETs using the DDSG and DCHG pins.
On an oscilloscope, we see an additional detection delay(8ms) along with the actual fault delay programmed on the AFE.
This additional delay is causing the AFE to take a late action in the case of SCD and OCD1. We have referred to the low side FET design resources and are testing the functions using the TI sample firmware.
For e.g., if a delay of 30us is configured for SCD, then the FETs are to be cutoff after 30us. But, we are seeing a total delay of 30us+8ms for the FETs to be OFF. What could be the possible reason behind the extra 8ms delay?
SCD does not seem to be OFF in the programmed period. The FET action is taken in a programmed delay + 8ms additional delay. This is prolonging the SCD time. This applies even to the OCD1 functionality.
Your valuable inputs are highly appreciated.
Note: FETs exclusively take approx. 100us to switch OFF.
Thanks,
Aqib