HiTI Experts
We are using the LM5060-Q1 in our EV BMS application, and our battery is of the swappable type.
In our recent BMS designs, we made modifications to the gate circuit to address a field failure. However, this modification has resulted in a new issue emerging after the release into field deployment.
We require your expertise in identifying potential failure modes as we are currently unable to replicate this issue. Could you please provide your email address so that I can share the full details of the design and analysis of this issue?
Thank you.
