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TLV1117LV: 1117 on 3 boards was damaged during EMC testing

Part Number: TLV1117LV
Other Parts Discussed in Thread: TPS54302

During EMC testing of the chip, 1117 on three boards was damaged,Please help analyze the reasons and provide improvement measures. Thank you!

The following are schematic diagrams, wiring diagrams, relevant testing standards, and testing site conditions.

The power chain is a 12V battery that is converted to 5V through TPS54302, and then this 5V circuit is simultaneously converted to 3.3V through 1117 and boosted by MT3608

TR-E-117B 辐射抗扰度(RI)-ALSE法试验测试记录.pdf

  • Hi Tonyx,

    The language of the document is not in english, but it looks like this is a radiated immunity test. It looks like multiple IC's failed, so I don't know if the test caused the LDO to break first or if the LDO failed as a result of these other IC's failing.  I would start by reviewing abs max violations around the LDO using an oscilloscope, if you are able to run this test again.  Make sure that the LDO did not get shorted to other power rails as a result of these failures - if so, the LDO may not have broken first but it may have failed as a result of another IC failing.  Review the temperature of the LDO to confirm it does not enter current limit protection or thermal protection.