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TPS73801-SEP: Si chips used in catalog and SEP

Yohei Kusachi
Prodigy 110 points
Part Number: TPS73801-SEP
Other Parts Discussed in Thread: TPS73801, ADC128S102-SEP, ADC128S102, LMX2694-EP, LMX2694-SEP

To Whom It May Concern,

 

Hope you're well.

 

Please allow me to submit inquiry as below.

 

<Inquiry>

 

Are the same Si chips used in each of the following combinations ① to ③?

1.：TPS73801 Family  &  TPS73801-SEP2.   

2.：ADC128S102 Family  &  ADC128S102-SEP

3.：LMX2694-EP Family &  LMX2694-SEP 

We'll be grateful if you could kindly provide your knowledge and thank you for your kind support.

Kind Regards,

Yohei Kusachi

Fuji Electronics America, Inc.

  • 0
    TI__Genius 10310 points

    Hi Yohei,

    Unfortunately we can’t share this type of information specific to a device. Typically there are differences between space-grade and commercial-grade devices. These differences can be in form of process, layout, design changes. These are done to improve radiation performance of space device. Please note that radiation performance for commercial device can be significantly worse compared to space qualified device even though electrical performance is identical. In addition there are several factors on commercial device that makes it risky for space applications. Some of important factors:

    • No single controlled baseline: Translates to high variability of radiation performance
    • Mostly use copper bond-wire: May not be reliable for space environment
    • No testing for radiation at lot level: High risk of getting devices that have poor radiation level

    All the best,

    Sarah

  • 0 in reply to Sarah Koch
    Prodigy 110 points

    Hi Sarah,

    Thank you so much for your kind reply in detail.

    The reason for this question was to find out whether SEE test data from one device can be applied to the another.

    Do you happen to have any idea if SEE data can be used for both commercial parts and Space EPs if they use same Si chips?

    Thank you again for your kind support and attention.

    Kind Regards,

    Yohei

  • 0 in reply to Yohei Kusachi
    TI__Genius 10310 points

    Hi Yohei,

    Happy to help.

    To answer your follow-up question, the SEE data collected for a device should only be considered valid for that device. It cannot be applied generally across a family of devices with different part grades. There is some extra background in the "Radiation Challenges" section of this Application Note on Space EP devices.

    Thanks,

    Sarah

  • 0 in reply to Sarah Koch
    Prodigy 110 points

    Hi Sarah,

    Hope you're well and thank you so much for your kind reply.

    The SEE data collected for a certain device can not be applied across to the other family devices, noted with a thanks.

    Thank you so much again for all the kind support and hope you'll be having a great rest of your day.

    Kind Regards,

    Yohei Kusachi