TPS54240: PCN#20231222000.1

Hi Shunsuke-san,

Sorry for the delay.  See the responses in Bold to your questions below:

(1)Is the additional wafer processing plant CFAB located in Chengdu, China?

Answer: Yes

(2)Where is the new inspection factory CD-PR located in China?

Answer: Yes

(3)Questions about the failure of the 1pcs test from the Life Test (Ta=125°C, 1753hours, 3/267/1).

　①What is the root cause of the failure of the Life Test?（Is the addition of wafer processing plants having an impact?）

Answer: TI electrical testing and physical failure analysis attribute this EIPD failure from single-event electrical transient or strike during extended HTOL stress.

　　Also, what does 8D available mean?

Answer: 8D is a report that includes the analysis that was performed to find the root cause for the HTOL failure.

　②How many hours did the Lite Test fail occur?

Answer: The single unit failure occurred at 1753 hours. Real time monitoring.

　③Lite Test has been conducted until 1753 hours.

　　The reason why you didn't stop the test at 1000hours and ran the test until 1753hours is because there was 1pcs of failures?

Answer: This was a real time monitoring and so the parts passed 1000 hours with no issues and the test was continued to the first failure.

　④Please statistically and technically explain why it is okay to conduct PCN, even if the result is 1pcs of failure.

Answer: Parts passed qualification beyond the 1000 hour requirement.

Hope this clarifies and we can close this thread.

Best Regards,

Youhao

Hi Shunsuke-san,

Thank you and let us know if we can be further assistance. 

Best Regards,

Youhao