ATL431: Voltage or current required to cause catastrophic failure due to EIPD in

Part Number: ATL431

I have failure analysis showing EIPD as result of a catastrophic failure for part ATL431AQDBZR.

Unit2 was proceeded to Deprocess to investigate TIVA alteration site. At Metal1 Seat
Metal (TiN) Layer after Metal2 and Metal1 Al Layer removed, EIPD was confirmed in Capacitor at TIVA
alteration site.

What voltage or current would be required to cause this type of damage? The part is used in an automotive application.

For reference:

Device Analysis Services
FA QEM-CCR-2403-00326