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BQ35100: Current Leakage's possible effect on results

Part Number: BQ35100

Tool/software:

Hi, 

I have a product using the BQ35100 that's in design verification stage at the moment.  We realized that there was a mistake made in the design where the I2C IOs were being driven at 1.8V whereas the VCC for the BQ35100 was 3.6V, so it was causing some current leakage and drawing more power than expected.  

We have since fixed this issue in our design and now have some units that are fixed and some from the older batch that don't have the fix.  I want to know if this current leakage could possibly have an effect on the coulomb counter in the BQ35100?  I'm seeing wildly varying results on different boards that don't have this fix where some are severely under reporting battery capacity usage and some are over reporting.  I've also gone through recalibration with several of these boards and still see the issue, so calibration didn't help.  

The other thing that could be contributing is that our usual power consumption by the device (at idle) is around 150uA to 220uA.  The BQ35100 only allows a calibration to be above 1mA, so what kind of load do you suggest I use for calibration?  I see in the reference manual that 1A is typical but drawing 1A through my board will probably destroy a load switch or two.  

Thanks!

  • Hello Chad,

    For calibration we usually recommend to calibrate at -1000mA, however if that is not possible on your board then I would say -500mA. Leakage current will affect the gauge performance at getting accurate data. As you said, this is most likely affecting the coulomb counter on the gauge.

    Regards,

    Adrian