Tool/software:
Hi team,
My customer Valeo are using TPS92515-Q1 for their project. And they found when test with same board at different power cycle, they found the IL-peak sometimes is different, causing output current accuracy can't meet requirement.
Refer to the formula in the datasheet, it seems related to VCST_Offset, tDEL. So my question is for the specific single IC on customer's board, will the VCST_Offset, tDEL value changed at different test power cycle, Power cycle means power on and off? If not , can you please provide more ideals about why this happen?
Best Regards,
Xiaowei Zhang