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TPS92515-Q1: IL-Peak Different when Test with Same Board

Part Number: TPS92515-Q1

Tool/software:

Hi team,

My customer Valeo are using TPS92515-Q1 for their project. And they found when test with same board at different power cycle, they found the IL-peak sometimes is different, causing output current accuracy can't meet requirement.

 

Refer to the formula in the datasheet, it seems related to  VCST_Offset, tDEL. So my question is for the specific single IC on customer's board, will the VCST_Offset, tDEL value changed at different test power cycle, Power cycle means power on and off? If not , can you please provide more ideals about why this happen?

  

Best Regards,

Xiaowei Zhang