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LMG2100R026: About corruption modes

Part Number: LMG2100R026


Tool/software:

The GAN is damaged immediately after it is driven.
When checking with a tester after damage, the resistance value between Vcc and GND is low.
In what cases would this type of damage occur?
Also, looking at the waveforms, the high-side switching appears to be unstable and malfunctioning.
I don't know if this is related to the damage, but I think there is something wrong with the internal gate driver that is causing the abnormality.
 
  • Hello,

    Please help provide some more context here, first with the use case:
    - Topology
    - test conditions
    - additional observations

    Next, can you share any waveforms? It would be helpful to understand what VCC voltage is applied, any SW waveforms, and also waveforms that show the "unstable" switching you describe.

    Thanks,
    Zach S