Other Parts Discussed in Thread: CSD19502Q5B, UCC27714,
Tool/software:
In a UCC28C43 + UCC27714 + CSD19502Q5B NexFET push-pull 100W isolated DC-DC:
Severe high-frequency ringing causes EMI test failures.
MOSFET temperature exceeds 85°C at 80W load.
Questions: How to simultaneously reduce ringing and MOSFET temperature?
For push-pull designs, are active clamp circuits or other proven methods available?
Appreciate your help!