UCC21710-Q1: UCC21710 OC Issue

Part Number: UCC21710-Q1
Other Parts Discussed in Thread: UCC21710

Hi All,

We are trying to use the UCC21710 and we are having an overcurrent shutdown on our LS FET Driver. We have tried floating it and pulling it down with a 3k. No luck. We tried completely shorting the pins and still faulted. We have been unable to successfully stop the LS from faulting and replaced the chip as well as supporting circuitry. Attached is a schematic. We are not using the Temp sensor currently either. We are trying to drive the AIMCQ120R030M1T, a 1200V SiC FET. It is being powered by the UCC15241, and these voltages function without issues.

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  • Hi Noah,

    Thanks for reaching out. I will provide a response by tomorrow.

    Best regards,

    Muiz.

  • Hi Noah,

    Apologies for the late reply.

    When you say that you tried shorting the pins and the device still had a fault. I assume that you're referring to shorting the OC pin to ground? If that is the case, OC detection is disabled and the device will not catch a fault. Can share waveforms showing RDY, FLT and power supply behaviors during this overcurrent condition. 

    Best regards,

    Muiz.

  • Hi Muiz,

    Yes. When we startup the red LEDs flicker as if there is a fault being detected, but R200 is not present so there is no current flowing through the path. Additionally, when we replace the chip and lift the pins off the pad, then we maintain a solid red LED and no faults are detected. How would we have faults on the on the output side when there is no current flow?

    Regards,

    -Noah

  • Hi Noah, 

    Can you please send me zoomed in waveforms showing FLT, output, DESAT and input signals for me to debug. Also, does this issue happen all the time with the unit or does it only happen under specific conditions?

    In addition, you mentioned that when you don't see the issue when you place the chip and lift the pins off the pad. Are you saying that even a new unit showcases this unusual behavior until you float the pins? If so, what pins are you referring to?

    Best regards,

    Muiz.

  • Yes when you lift pin 1 and pin 2 and connect to pin 3 then the issue does not occur. When connecting Pin 1 and Pin 2 to the layout, the fault occurs even if the R200 is removed from the circuit. Therefore there should be no issues with FLT since it is not being utilized according to the datasheet.

    The issue is very intermittent and occurs at various loading conditions or on a heatsink. I will try and provide FLT, Output and Desat signals during a dropout.

    Regards,

    -Noah

  • HI Noah,

    I'll be on the lookout for your response with the waveforms.

    Best regards,

    Muiz

  • Hi Muiz,

    Attached are the different dropouts related to these UCC21710 chips. As you can see the voltage is stable, and the data is being provided to the input of the gate drivers. FLT goes low even though it is completely disconnected as I previously stated. It seems that when the FLT goes low we usually have issues with the dropout of the gate signals. The Voltage appears stable via probing. We also looked at trying low pass filtering into the input and output side of the gate driver. Both of these did not fix our problem either. At higher loads all of the gate drivers dropout. We changed to the UCC5320SCDR and these work perfectly in the same setup. Can you please explain the difference in the isolation used or how the fault could be causing us these issues?

    There is another E2E forum with several people with the same problem. Is there an issue with the chip?

    https://e2e.ti.com/support/power-management-group/power-management/f/power-management-forum/1552592/ucc21710-q1-issue-of-ucc21710-q1?tisearch=e2e-sitesearch&keymatch=UCC21710#

    https://e2e.ti.com/support/power-management-group/power-management/f/power-management-forum/1487858/ucc21710-gate-driver-tripping-on-over-current-fault-when-it-is-already-bypassed?tisearch=e2e-sitesearch&keymatch=UCC21710#

    Image 1: Ch 1-3 Phase A-C LN, Ch 4-6 Phase A-C Current, Ch7 Modulation Waveform, Ch8 Output Gate Driver

    Image 2: Ch 1-3 Phase A-C LN, Ch 4-5 Phase A-C Current, Ch6 In+ (LS_IN) Ch7 Modulation Waveform, Ch8 Output Gate Driver Dropout

    Image 3: Ch 1 Phase B LN, Ch2 IN+ (LS_IN), Ch3 In- (HS_IN) Ch 4-5 Phase A, Phase B Current, Ch6 Nothing was PRobed, Ch7 FLT Open Collector Pin, Ch8 Output Gate Driver

    Image 4: Ch 1 Nothing was Probed, Ch2 IN+ (LS_IN), Ch3 In- (HS_IN) Ch 4-5 Phase A, Phase B Current, Ch6 Nothing Probed, Ch7 FLT Open Collector Pin, Ch8 3.3V Signal

  • Hi Noah,

    The problem you're seeing is likely due to system-level noise. High system-level noise can affect the internal fault detection signal-chain in the device, causing it to incorrectly detect a fault. You don't see the same issue with UCC5320SCDR because it's a device without protection so there's no signal to corrupt. To solve the problem you're seeing, you would have to reduce the noise. Depending on your noise source, I can recommend the following:

    If your noise source is from the output,

    • Add a ferrite bead in the gate loop. Ensure that your ferrite bead selection aligns with the noise frequency.
    • Increase gate resistance
    • Add Vgs capacitance on gate (in 10-100pF) range

    If your noise source is SW node/COM-GND noise,

    • Add ferrite bead from IGBT emitter to COM pin. Ferrite bead selection should align with noise frequency.
    • Increase gate resistance to slow down switching
    • Add Y-caps on VEE-GND of gate drivers

    If your noise source is from the power supply, you can add chokes/ferrite beads between power supply to VCC/VDD/VEE pins.

    Best regards,

    Muiz.