Other Parts Discussed in Thread: BQ76907, BQ76972
Hi,
I would like to check if the BQ76907 and BQ76972 devices include any feature or diagnostic capability to detect an increase in contact resistance for cell interconnects, or to enable early detection of busbar or terminal degradation (e.g., due to corrosion or poor mechanical connection).
If such functionality is available, could you please provide more details on the detection mechanism, recommended measurement method, or any application notes or reference designs related to this feature?
Thank you for your support.