I am working on the design of a negative buck converter that uses the LM5146-Q1 as the driver. The converter has been operating successfully in approximately 50 systems. However, in 3 systems, the high-side MOSFET was damaged—possibly after the HO driver failed.
My questions for TI are:
- What could be the root cause of the damage in these three units?
- What internal behavior in the driver circuit could lead to MOSFET damage through the gate?


