Other Parts Discussed in Thread: STRIKE
Hi
There is no LatchUp data on the datasheet. Do you have the data?
Regards,
Koji Hamamoto
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Hello Hamamoto-san,
I did confirm the UCC27517 passed latch up testing during the device qualification testing. I will have to confirm the test conditions of the latch up testing performed.
Richard Herring
Hi Richard-san, Peter-san
Thank you for your support.
Our customer would like to know the condition of the latch-up testing as well.
Regards,
Koji Hamamoto
Hello Hamamoto-san,
I reviewed the internal test procedure for the latch up testing, to determine the test conditions. Our internal qualification for latch up references JEDEC JESD78, IC Latch Up Test.
For the UCC27517 the test conditions of the latch up will be:
Input and output pins: Positive and negative strike current +/-100mA. Voltage limits: +20V, -5V. (The source is always limited to 100mA)
VDD: Positive and negative strike current +/-100mA. Voltage limits: +20V, -0.3V. (The source is always limited to 100mA).
After the strike current: IDD and pin current monitored to be <1.4x IDD and pin pre test currents.