Our customer is evaluating the bq25970 in their projects, and during their test, they are having below questions about device's specification, can you help to check them?
1. VAC OVP response time:
In our datasheet we claimed the reaction time typical is 0.1us, but during customer's board test and our EVM ferification, we measured the time is up to 1.3us which is too long for their application. Is this the normal specification for our device?
2. OVP_GATE pin oscillation issue:
During customer's OVP test, they found that the OVP_GATE pin will be oscillation under below conditions, do you know what's the problem in here?
a. Set OVP threshold to 11V, OVP MOSFET will shutdown at ~10.94V.
b. When decreasing VAC voltage to ~10.8V, we will see OVP_GATE pin oscillation like below waveform.
c. When continue to decreasing VAC voltage to below 10.5V, it recovers to normal.
3. Battery temperature detection circuit application issue:
Currently customer is following our EVM circuit to bias the NTC from VOUT(battery voltage), but this method will introduce leakage current from battery during product power off situation. Do we have any other methods to bias the NTC without drawing current from battery?
Thanks a lot!