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TLV733P-Q1: Are overcurrent protection and thermal shutdown 100% tested?

Kaji@PAN
Mastermind 7015 points
Part Number: TLV733P-Q1

Hi,

I am considering using the TLV73333PQDRVRQ1 device.
(Question)
Is the overcurrent protection (ILIM, IOS) and thermal shutdown (TSD) described in the data sheet electrical characteristics 100% tested?
Or is it a sampling inspection?

Best regards,

  • 0
    TI__Genius 13085 points

    Hi Kaji,

    The Ios (short circuit current limit) is implemented using the same current limit circuit which is tested on all devices during production. 

    The thermal shutdown is not tested during production since the production test setup and environment is not optimized for this type of testing. It seems simple to run a large power dissipation through the IC to generate thermal shutdown however this risks damaging the IC since you have to pull a high current and then when the thermal shutdown kicks in, that will cause an inductive voltage spike that could damage the IC due to the test environment having much more inductance than a real application (long traces, cables, contactors, etc...). That being said, thermal shutdown is a fairly simple circuit to implement and we have not seen any failures in any of our LDOs due to it. 

    We are evaluating ways to implement this type of testing on new LDOs in the future using a test mode however this will not be an option with already released devices.