LM46000-Q1: Evaluate materials to meet life requirements

Hi Kevin,

I will speak with the engineer responsible for this and get back to you with more information.

Please expect a 1-2 business day delay in response, thank you.

Regards,

Harrison Overturf

Hi Kevin,

I apologize for the delay in my response, AEC-Q100 tests for HTOL is typically 1000 hours @ 125C or equivalent which is what these parts are cetified for.

For these situations, it is recommended for automotive semiconductors to apply the ZVEI Robustness Validation Process which is detailed in the link below. Section 9.1.2 “Mission Profile Validation on Component Level” calls out applying intrinsic reliability knowledge (JEP122) to the mission profile. This will determine if the component in the system to be projected to be within it’s useful lifetime and not at its wear out stage. Another way of looking at ZVEI Robustness Validation approach is that it applies information gained in AEC Q100 Group D. This is more scientific than Arrhenius model.

I can run a ZVEI Robustness vaidtion approach assess for the LM46000QPWPRQ1 but I need the starting mission profile in order to do so.

https://www.zvei.org/fileadmin/user_upload/Presse_und_Medien/Publikationen/2015/mai/Handbook_for_Robustness_Validation_of_Semiconductor_Devices_in_Automotive_Applications__3rd_edition_/Robustness-Validation-Semiconductor-2015.pdf

Regards,

Harrison Overturf