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UCD9090-Q1: UCD9090-Q1 data retention over temperature

Part Number: UCD9090-Q1
Other Parts Discussed in Thread: UCD9090, TMS320F28386D

Hello,

The datasheet of the UCD9090-Q1 states that the data retention is 100 years minimum at 25°C (nice, I hope the component do last that long Stuck out tongue winking eye).

What is the data retention for this component  considering the whole recommended operational range ? (ie. 125°C junction/110°C free air).

Best regards,

C. Letonnelier

  • Hello

    The electrical charge stored in a flash memory cell degrades over time, and will degrade much faster at extended temperatures. This degradation has been modelled to follow the Arrhenius Equation, degrading exponentially as temperature rises.

    The flash of UCD9090-Q1 has been through the Data retention storage life test.  From there 100years life is calculated for 25C.

    The higher temp, the short retention life.

    Here is a document to explain the how the temp impact the retention life of the Flash inside the MSP430 which is not the exactly same as UCD9090-Q1.。This is just to give your a reference how the retention life changes based on the temp.

    https://www.ti.com/lit/pdf/slaa392 

     

    Regards

    Yihe

  • Hi,

    I checked the document you were pointing but it doesn't really give a proper answer to the question as it deals with accelerated test who were performed on the MSP430.

    I find it a bit troubling that you don't provide the information of retention for your part over the operating range of the device.

    We are designing equipment for the aeronautical field for which we must ensure the date retention in order to define scheduled maintenance in case the retention is lower than the aircarft life.

    I had asked for similar info for another of your components and I was given a clear value:
    https://e2e.ti.com/support/microcontrollers/c2000/f/c2000-microcontrollers-forum/960889/tms320f28386d-data-retention-above-tj-85-c/3550405#3550405

    Best Regards,

    Clément

  • Hello

    The data retention spec of UCD9090 is based on the qualification stress testing at 150C for 1000 hour. If you are following the Arrhenius equation, the data retention life is less than 1year when up to TJ 125C.

    The result is very similar as the data at the sharing application notes. 

    Regards

    Yihe

  • Hello,

    Less than one year for a component that is aimed for the automotive market seems like an abherration to me.

    Of course we won't be at maximum junction temperature but the mission profile of our helicopters are wide so we must take into account the worst case scenario, ie. 100°C for us.

    What I can see though from the report for the MSP430 is that the result were way better when using a baking temperature higher.

    So basically my understanding, when I see this report or the answer for the TMS320F28386D, is that the retention of the UCD9090 considering higher temperature would be way better than the figures you are giving me. You never performed qualification test of the part at higher temperatures to provide more accurate results ?

    Best regards,

    Clément

  • Hello

    The baking temperature will have impact on the retention life as explained in the report. MSP430 and TMS320F28386D have adopted different baking test.  I will check with the team to see whether there is a special high-temp Qual test done on the UCD9090-Q.

    Updates:

    There is a extended retention life test on the UCD9090-Q flash: it has been through 10000hour at 150C baking test which is after 20K program/erase cycle to ensure the retention life is at least10years @ 85C 

    Regards

    Yihe