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TPS7H3301-SP: Aging degradation effect
Part Number: TPS7H3301-SP
This is related to the aging question that was previously posted for this component. I'm carrying out an EOL analysis on this VTT regulator, but a longer mission scenario. Can you comment on whether this SP device will meet its datasheet specifications after 10yrs (876600hrs) across temperature (-55C to 124C)?
Because of QML Class V requirements we must meet datasheet/SMD for the period specified in MIL-PRF-38535. It’s a 15-year operating life at +65°C ≤ TJ ≤ 95°C.
For QML products the HiRel release process should ensure a 10-year continuous operating life to datasheet/SMD ROC unless otherwise specified. We make sure that the ROC limits have adequate CPK to ensure that the parts do not drift out of specification.
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In reply to Daniel Hartung:
Can you clarify one parameter in a particular? In the SMD sheet (5962-14228), Table IIB, gives the limits for the Burn-in and Life Operating test. I believe the life operating test is 2000 hrs at 125C. In this table the Output DC voltage, VO (Vvosns/Vttsns) parameter has a limit of +/-27mV while the datasheet limit is noticeably tighter, i.e. +/-6mV. Obviously the SMD limit is much wider for a much shorter duration then 10 years. Which is the more reliable indication of the drift on this parameter over 10 years? Is it the datasheet or is this one of the unless otherwise specified conditions?
In reply to John Rodriguez:
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