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LMZ14201: LMZ14201

Part Number: LMZ14201

A few questions on this part:

- Is the part CMOS or bipolar

- Did the part pass electrical latchup?

munir

  • Hi Munir,

    The LMZ14201 use MOSFETs for the HIGH-side and LOW-side switching. The parts pass ATE testing for various events such as continuity,  short circuit, over voltage, thermal shutdown and several other conditions that could fault the part. Is there anything specific you are looking for?

    What application are you planning on using this device in?

    Regards,
    Jimmy

  • Jimmy,
    I am a radiation consultant and one of my customers asked me to assess the part for single event latchup and total ionizing dose.

    So, my question if TI tested this part for electrical latchup answers part of my concerns. Electrical latchup testing is part of reliability testing.

    thanks

    munir
  • HI Munir,

    I have asked and currently waiting to get more information on the rel reports that should have single event latch up test. Sorry for the inconvenience. When I get the information, I will inform you asap.

    Regards,
    Jimmy
  • Thank you I look forward for the latchup report.

    In the previous thread you said that ATE test was done.  Does this mean electrical latch up testing was part of the test, because usually it is not.

    Also you said the HIGH-side and LOW-side switching are MOSFETs.  Does this mean all the circuitry MOSFETs?

    munir

  • Hi Munir, 

    I believe ATE only checks for continuity and operation of the device. The reliability report should give you further information on what tests have been conducted on the device during validation of the part.

    In an applications point of view, I was referring to the two obvious switches (HIGH-side and LOW-side) which are MOSFETs. I'm sure there are a few BJTs in the device. Did you want something specific regarding the MOSFETs or BJTs? 

    Regards,

    Jimmy