TMS320C6748: Fail occurs at Vix of Clock line in Fast/Typ condition

Part Number: TMS320C6748

Tool/software:

Hi Team,

We are performing SI analysis of the connection I/F between TMS320C6748EZWT4 and DDR2.

Fail is occurring in Vix of Clock line during Fast/Typ condition.

The difference in the rise and fall times of the IBIS model on the DSP side may be a factor.

Is there any way to improve this crosspoint misalignment?

The following is the Clock line waveform under Fast conditions.

Because the P/N cross point is below the allowable voltage range Vix_min

It does not meet JEDEC's Vix requirements.

Therefore, the memory circuit may not function properly.

  • Hello Masaki Takeuchi

    Thank you for the query.

    Help me understand if you are doing the analysis based on some failure or is this a new design that you are considering.

    We are performing SI analysis of the connection I/F between TMS320C6748EZWT4 and DDR2.

    Could you please share additional information on the connection made for simulation.

    Regards,

    Sreenivasa

  • Hi Sreenivasa,

    Sorry for the delay in contacting you.

    This is a new design that I am considering.

    Best Regards,

    Masaki Takeuchi

  • Hello Masaki Takeuchi,

    Please refer inputs i received from the expert:

    Seems like they are having an issue meeting the JEDEC spec for VIX. My suggestion would be for them to closely inspect the routing of the DQS traces on their board. If the DQS is not routed as a pure differential pair and non-symmetry gets introduced in the routing, it can lead to VIX violations as they are observing.

    Regards,

    Sreenivasa

  • Hi Sreenivasa,

    Actually, we have not yet resolved this issue.
    There was indeed an asymmetric part of the pattern you pointed out, and we corrected it, but it did not improve.

    For example, could it be improved by inserting a common mode coil in the CK+ and CK- lines of the DSP?
    Also, is it OK to put a common mode coil in this line?

    We apologize for the inconvenience, but we would appreciate it if you could confirm the above.

    Best Regards,

    Masaki Takeuchi

  • Hello Masaki Takeuchi

    Thank you.

    For example, could it be improved by inserting a common mode coil in the CK+ and CK- lines of the DSP?
    Also, is it OK to put a common mode coil in this line?

    Do you have prior experience adding filters?

    Regards,

    Sreenivasa

  • I do not have any prior knowledge of using common mode coils to mitigate SI issues in DDR so I cannot comment on that. After reviewing some of the comments, I would suggest that they look into the below items: 

    1. What is the differential impedance of the CK+/- traces? Even if there is no visible asymmetry in trace routing, there can be variations in the differential impedance.
    2. What is the pkg and Ccomp capacitance for the CK+/- pins in the DRAM IBIS model?
    3. What is the power supply noise on the DDR IO power? Excessive supply noise can also manifest in SI issues

    Regards,

    Sreenivasa

  • Hi Sreenivasa,

    //Question1

    -What is the differential impedance of the CK+/- traces? Even if there is no visible asymmetry in trace routing, there can be variations in the differential impedance.

    //Answer

    We have already sent you the results of the study we conducted here, and as mentioned there, a direct connection between the driver and memory resulted in an NG judgment.

    If the driver and memory are directly connected, variations in the differential impedance of the wiring are irrelevant.

    In other words, Vix failure occurs in situations where the influence of wiring is not relevant.

    //Question2

    -What is the pkg and Ccomp capacitance for the CK+/- pins in the DRAM IBIS model?

    //Answer

    The DDR2 memory data currently in question is as follows.

     

    [Component] NT5TU64M16HG (NANYA)

    [Package Model] nu88a1p80v11_cm_pkg_x16

    [Manufacturer] NANYA Technology Corp.

    [Pin]      signal_name       model_name      R_pin           L_pin             C_pin

    J8        CLK               CLKRCV             468.5m         1.73nH          0.41pF

    K8         CLKB               CLKRCV             437.3m          2.08nH          0.33pF

     

    [Model]          CLKRCV_Input_667

    C_comp                      1.35pf(typ)              1.33pf(min)               1.38pf(max)

     

    For reference, we also simulated DDR2 data from a completely different manufacturer.

    The DDR2 data is as follows.

    Even in this case, Vix NG occurred and did not improve.

     

    [Component]     MT47H64M16NF (Micron)

    [Package Model] u88b_84ball_pkg

    [Manufacturer]  Micron Technology,Inc.

    [Pin]  signal_name      model_name      R_pin             L_pin             C_pin

    J8      CK                       CLKIN               169.5m          1.995nH         0.369pF

    K8     CK#                    CLKIN                167.9m          2.073nH         0.360pF

     

    [Model]        CLKIN_533

    C_comp                      1.025pF(typ)             0.975pF(min)             1.075p(max)

     

    //Question3

    -What is the power supply noise on the DDR IO power? Excessive supply noise can also manifest in SI issues

    //Answer

    In this analysis, we use the ideal power supply voltage listed in IBIS.

    Therefore, We think it should not be a problem.

    Best Regards,

    Masaki Takeuchi

  • Hello Masaki Takeuchi

    Thank you.

    I am checking internally and will update you with inputs i received.

    Regards,

    Sreenivasa

  • Hi Kallikuppa,

    Thank you for your support.

    I appreciate it.

     Best Regards,

    Masaki Takeuchi