Hello,
I'm doing JTAG testing with the XDS110 emulator.
However, the following error occurs:
```
This error is generated by TI's USCIF driver or utilities.
The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.
The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
```
I think there is a problem with the "TRST" pin.
After turning on the power, measuring the voltage of the "TRST" pin with a multimeter displays "0V".
Is this normal?
Thanks.
