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TRF370417: TRF370417 LO leakage

Part Number: TRF370417
Other Parts Discussed in Thread: DAC3484, , DAC3283


Would like to check is the carrier feedtrhough referring to the LO power leak at the RF output.? For example, for a LO freq of 4GHz, the LO level at the RF output port is -36dBm? (datasheet fig 13)

What is difference between adjusted and unadjusted carrier feedthrough? How do I achieve the adjusted state as it as a better performance? 

  • Hi,

    yes, correct. This is the typical LO leakage level.

    Adjusted carrier feedback through need to have DC offset correction between I and Q input. There are features in the DAC devices such as DAC3283 and DAC3484 family that have such feature to adjust the differential DC offset, which may lower the LO leakage level at the TRF370417.


  • Hi Kang, 

    Thanks for the clarification

    Can I also check on the IF to RF leak spurious level?

  • Hi

    We do not have such specification as typically the interface between DAC and modulator have anti-aliasing filter. All the images of the DAC will be filtered out around 4GHz in band.


  • Hi Kang, 

    How about those IF freq (example 500Mhz)  which is in-band. The 500MHz will leak into the RF port. 

    Can I also check on those mixer spurious., for example. 2I*1L, 1I*2L  and other mixer spurious. For those spurious, can I assume it will meet the OIP2 and OIP3 specs in the datasheet? 

  • Hi Sim,

    We do not have such performance plots for the IF leakage. These RF products were tested with Keysight ESG with limited bandwidth. Therefore, they did not characterize IF leakage at the time, and we do not have the characterization data for these.

    I recommend that you utilize boards such as TSW3085 or TSW3084 EVMs to evaluate the TRF370417 with DAC products, or interconnect any DAC of your choice to the TRF370417 to evaluate these parameters.

    Sorry this is a legacy product. To fully characterize these parameters I will need business case from you. You may contact me offline if you wish to pursue this.