This thread has been locked.
If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.
OPT9221: MAC test features
Part Number: OPT9221
I am taking a new prototype into operation. The OPT9221 delivers datat directly into an FPGA which is supposed to do something with the depth data but currently is configured to just forward the meta pixels (32Bit). I am getting depth images in 4-Byte-mode (DE0x25 OP_DATA_ARRANGE_MODE = 0). Since I am having issues with the depth data I first have to rule out the FPGA part is not doing any unintended byte manipulations. Thus, I have activated ROW-ramp test-pattern (DE0x31 MAC_TEST_ENABLE = 1, RAMP_PAT = 1) and optained this test image for amplitude data:
Next I activate the column test pattern Thus, I have activated ROW-ramp test-pattern (DE0x31 MAC_TEST_ENABLE = 1, RAMP_PAT = 2) and optain this image for amplitude data:
Both images are obviously ill formed.
Now I would need the reference images how the data should look like in these modes (that is, what test patterns are for). But these references cannot be found in the SBAS703A –JUNE 2015–REVISED JUNE 2015 OPT9221 chip documentation. Could you plese provide the expected test data images. This would help a lot.
I assume the continous pixel data is comming out the chip in a little-endian format: AC0-Byte0, AC0-Byte1, FP0-Byte2, FP0-Byte3, AC1-Byte0, AC1-Byte1, FP1-Byte2, FP1-Byte3 ...
Hopefully this assumption is right?
Thanks in advance, Frank.
We are glad that we were able to resolve this issue, and will now proceed to close this thread.
If you have further questions related to this thread, you may click "Ask a related question" below. The newly created question will be automatically linked to this question.
In reply to Suramya Gupta:
I have Firmware 0.31 installed on the sensor. Is there any update I shoul use?
before starting the capture of test images I checkted the register settings you mentioned above. They carry their default values:
PID:03440057 TID:03450056 OM/TOF(I): OPT9221DE_REG_FB_CONTROL: 0x005604PID:03440057 TID:03450056 OM/TOF(I): OPT9221DE_REG_COEFF_ILLUM: 0x000000PID:03440057 TID:03450056 OM/TOF(I): OPT9221DE_REG_COEFF_SENSOR: 0x000000
The noise on the test images stays the same. Are there any other register settings that may influence the quality of the test images obtained? Meanwhile I have also checked the FRAME_RAMP mode but it shows the same noise:
Also, can you please confirm the sequence of bytes obtained when operating in 4-Byte mode? It is about the endianess. Each meta-pixel has four bytes. First amplitude then phase is transmitted. For the amplitude is Byte-0 transmitted first or Byte-1? It is not clear from the OPT9221 documentation.
In reply to Frank Papenfuss:
Data is returned as little-endian. Based on the patterns, your decoding is correct.
By noise, do you mean the pattern on the left edge of the image? That is expected. If you see the example data, you'll see a similar pattern. The frame ramp pattern looks similar to the one we get from the OPT8241-CDK-EVM.
For verifying the test pattern, it would be best if you captured the pattern when the camera is running properly (reference pattern) and compare the received test pattern to the reference pattern for checking if OPT9221 is working correctly. The actual pattern on the left edge shouldn't matter for the same.
meanwhile we performed much more testing and we have found a severe problem with our implementation. Here are steps that we have performed:
My question now is: Are the saturation pixels part of the intended test data the OPT9221 is supposed to output? - since I am using FW0.31 this could have changed. I mean the test data could have been enriched.
I wonder because pixel saturation is not seen in the VoxelViewer-test-data that I could download from the official VoxelSDK GitHub site.
I also would like to raise the request to update the information in the OPT9221 data sheet:
Can you confirm that the diagram in Fig.1 on page 13 of the OPT9221 documentation is wrong and that the OP_DATA* lines must be sampled at the falling edge of the OP_PIXCLK?
All content and materials on this site are provided "as is". TI and its respective suppliers and providers of content make no representations about the suitability of these materials for any purpose and disclaim all warranties and conditions with regard to these materials, including but not limited to all implied warranties and conditions of merchantability, fitness for a particular purpose, title and non-infringement of any third party intellectual property right. No license, either express or implied, by estoppel or otherwise, is granted by TI. Use of the information on this site may require a license from a third party, or a license from TI.
TI is a global semiconductor design and manufacturing company. Innovate with 100,000+ analog ICs andembedded processors, along with software, tools and the industry’s largest sales/support staff.