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TS5A3166-Q1: IN pin input leakage measurement higher than spec

Jim Brinkhurst1
Mastermind 44680 points
Part Number: TS5A3166-Q1

Hi Experts

I am trying to verify the Input leakage current spec in the datasheet. 

I am applying 5.5V to the V+ supply pin and then sending +5.5V and/or 0V to IN (pin 4). 

I see leakage of 89nA at V_IN = 5.5V, and 123nA with V_IN = 0V.

Can someone provide guidance on why I see these results or how to measure this more accurately?

Thanks in advance for your help.

Best regards,

Jim B

  • 0
    TI__Mastermind 24440 points

    Hello Jim,

    1.I wanted to ask if you what is your setup for the leakage current test?

    2.Also what measurement tool are you using for this test?

    Let me contact our validation team to see how we measure very precise leakage currents like your are seeing.

    Please respond at your earliest convince!

    Regards,

    Kameron

  • 0 in reply to Kameron Hill
    TI__Mastermind 44680 points

    Hi Kameron

    Please let me know if you have more details on how the validation team measure this parameter.

    Our setup is all pin NO, COM, INPUT and Vcc pin connected to BNC connectors on PCB.

    We used Keysight B2912A precision source/measurement unit to test leakage current.

    For input leakage current, we connected output of this equipment to INPUT pin of the device.

    Thanks for your help.

    Best regards,

    Jim B

  • 0 in reply to Jim Brinkhurst1
    TI__Mastermind 24440 points

    Ok  Jim will update this forum soon with more info!

  • 0 in reply to Kameron Hill
    TI__Mastermind 24440 points

    Hello Jim,

    I have an update for you on this issue. After talking with the validation team here is what I found.

    This issue you are seeing could be setup related and also board related. The validation team uses boards that are made to have less parasitic leakage.

    One thing you could do is take the same measurement with out the unit and do an open socket calibration of your setup. Basically you do the same test with and without the device and the delta in the measurement is what is actually caused by the device.

    Regards