TMUX6119: Long term drift of leakage current

Hi Shota-san,

The TMUX6119 has gone through stringent qualification process like all of the TI devices to ensure long term reliability and performance sameness.

Specifically, the HTOL (high temperature operating life) test is a life test and helps determine the reliability of the device and emulates the life cycle of the product at elevated conditions (i.e. 1000hrs@125C per JEDEC standard). We do parametric testing before stressing the device (Pre-HTOL) and after stressing the device (Post-HTOL) to make sure the device still meets the required results within specific margin and no drift or damage.

By design, there is no concern over these parameters drifting. Over the life of the products, there will always be some shift across any semiconductor product and that will be within the datasheet specifications unless there is a catastrophic failure due to any reason/external factors.

Hope this helps.

Thank you,

Regards,

Sandesh