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the standard path-length test on the JTAG IR and DR

Vijay Hiremath
Intellectual 330 points
Other Parts Discussed in Thread: TMS320C6748, TMS320C6657, CC3200

Hi,

i am trying to connect XDS100v2 JTAG with my board(TMS320c6748)... i am getting following error.

[Start]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Dec 19 2011'.
The library build time was '21:32:12'.
The library package version is '5.0.569.0'.
The library component version is '35.34.39.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will now attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 512 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

can anyone specify what is that standard path length test on JTAG IR and DR?

it says some of the values were corrupted??? what is the significance of this?

  • TI__Guru**** 171309 points

    Vijay,

    Please check the two forum posts below that have some interesting insights on further pursuing a solution to this issue.

    http://e2e.ti.com/support/development_tools/code_composer_studio/f/81/p/225847/795396.aspx

    http://e2e.ti.com/support/development_tools/code_composer_studio/f/81/p/74039/270668.aspx

    Hope this helps,

    Rafael

  • in reply to desouza
    Intellectual 330 points

    Rafael,

          i checked the connection there is no short between TDO and VCC. but still i am getting following error.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    is there any cause that processor holds TDO high?

  • in reply to Vijay Hiremath
    Intellectual 840 points

    Hi,

    Any solution for this ?

    Ivgeni.

  • in reply to ivgeni kuqw
    TI__Guru**** 244400 points

    Hello Ivgeni,

    The probable cause

    1. The Chip is not working

    2 The wrong connector may have been used for interfacing of JTAG.

    If you have a specific issue like this, then you would need to publish the following details

    1. The schematic of the header on the board?

    2. The XDS100V2 model being used?

    Regards

    Amit

  • in reply to Amit Ashara
    Intellectual 840 points

    I am working with the TMS320C6657 

    I can’t connect my board to JTAG .

    Debug LED's are off.

    Only D17 (yellow), D2 (blue) are on D1 blinks (red ) on startup.3

    Test connection LOG :

    [Start]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\ivgenik\AppData\Local\.TI\213602635\
    0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Aug 30 2012'.
    The library build time was '21:58:20'.
    The library package version is '5.0.838.0'.
    The library component version is '35.34.40.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 512 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End]

     

    Thanks,

    Ivgeni Kuhcerov

  • in reply to ivgeni kuqw
    TI__Guru**** 244400 points

    Hello Ivgeni,

    XDS100V2 has two header types. ARM header and TI Header. Which header it is? This could be happening because the board may be having a ARM header but the XDS100V2 may be having a TI header for which the Pins do not match for TCK-TDI-TDO-TMS

    Regards

    Amit

  • in reply to Amit Ashara
    Intellectual 840 points

    I don't know.

    How can I check it ?

  • in reply to ivgeni kuqw
    TI__Guru**** 244400 points

    Hello Ivgeni

    Can you please send the schematic for the board and the full model number of the debugger

    Regards

    Amit

  • in reply to Amit Ashara
    Prodigy 160 points

    Hii

    I am using Blackhawk XDS100V2 for debugging of CC3200 .

    i am also getting same errors  as follows

    [Start]



    Execute the command:



    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity



    [Result]





    -----[Print the board config pathname(s)]------------------------------------



    C:\Users\SHIVA-~1\AppData\Local\.TI\693494126\

    0\0\BrdDat\testBoard.dat



    -----[Print the reset-command software log-file]-----------------------------



    This utility has selected a 100- or 510-class product.

    This utility will load the adapter 'jioserdesusb.dll'.

    The library build date was 'May 21 2014'.

    The library build time was '17:19:59'.

    The library package version is '5.1.507.0'.

    The library component version is '35.34.40.0'.

    The controller does not use a programmable FPGA.

    The controller has a version number of '4' (0x00000004).

    The controller has an insertion length of '0' (0x00000000).

    This utility will attempt to reset the controller.

    This utility has successfully reset the controller.



    -----[Print the reset-command hardware log-file]-----------------------------



    The scan-path will be reset by toggling the JTAG TRST signal.

    The controller is the FTDI FT2232 with USB interface.

    The link from controller to target is direct (without cable).

    The software is configured for FTDI FT2232 features.

    The controller cannot monitor the value on the EMU[0] pin.

    The controller cannot monitor the value on the EMU[1] pin.

    The controller cannot control the timing on output pins.

    The controller cannot control the timing on input pins.

    The scan-path link-delay has been set to exactly '0' (0x0000).



    -----[The log-file for the JTAG TCLK output generated from the PLL]----------



    There is no hardware for programming the JTAG TCLK frequency.



    -----[Measure the source and frequency of the final JTAG TCLKR input]--------



    There is no hardware for measuring the JTAG TCLK frequency.



    -----[Perform the standard path-length test on the JTAG IR and DR]-----------



    This path-length test uses blocks of 512 32-bit words.



    The JTAG IR instruction path-length was not recorded.



    -----[Perform the Integrity scan-test on the JTAG IR]------------------------



    This test will use blocks of 512 32-bit words.

    This test will be applied just once.



    Do a test using 0xFFFFFFFF.

    Scan tests: 1, skipped: 0, failed: 0



    -----[An error has occurred and this utility has aborted]--------------------



    This error is generated by TI's USCIF driver or utilities.



    The value is '-154' (0xffffff66).

    The title is 'SC_ERR_FTDI_WRITE'.



    The explanation is:

    One of the FTDI driver functions used to

    write data returned bad status or an error.



    [End]

    If anyone have solution please reply ASAP.

    Regards

    Amaresh

  • in reply to Amaresh Nayak
    TI__Guru**** 244400 points

    Hello Amaresh

    This looks to be a driver issue. The JTAG integrity never got completed either.

    Regards

    Amit

  • in reply to Amit Ashara
    Prodigy 160 points

    Hi Amit,

    Thanks for your reply.

    I reinstalled again but  giving  the same error.

    Can you please tell the steps to  create  a new Target configuration for CC3200 using Blackhawk  XDS100V2.

    Awaiting for your reply.

    Thanks & Regards

    Amaresh

  • in reply to Amaresh Nayak
    TI__Guru**** 244400 points

    Hello Amaresh

    I do not have a CC3200 setup with me. But there should be existing example codes for the same in it's software release. Isn't it so? You may want to take the forum post to the CC3200 Forum

    Regards

    Amit