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CC2540T: Burn-in statistics for operation above rated temperature (125C)?

Part Number: CC2540T

Can TI provide any burn in test statistics to help us estimate the likely failure rates when operating outside temperature specification (125C)?

We have a low volume application where ambient temperatures above 125C are possible for limited periods. Initial samples of CC2540T, from a single production batch, have remained operational within our testing profile. 

Statistical information from a larger sample set would help us assess the viability of using this chip in our application.

  • Hi John,

    In general, we recommend against operating anything out of specifications - you'll lose TI's warranty and support of the part. In other words, operating outside specifications, you'll be on your own if you run into issues.

    As far as I know, we don't have any data on this - I'll forward this request to a coworker who may have more information.

    Regards,
    Rebel
  • Hello John,

    As Rebel states, TI does not have characterization data for operation above the specified 125C temperature for the CC2540T. As you observe, you may see proper operation in your testing but this can't be guaranteed across all lots. As with all silicon based electronics, the lifespan of the device will degrade with operation higher than the device's maximum temperature rating.

    Best wishes
  • Thank you for answering the question.

    I would mark this as answered if I knew, or could work out how to: I see "Verify Answer" and "Suggest Answer" buttons but the purpose and distinction of these is not obvious to me. ...a bit of searching reveals I am not alone in being baffled by these labels (e2e.ti.com/.../118041) ...Verify Answer it is.