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TMS320F28374S: Timing for Input clamp current overshot /IO undervoltage for -25'C HBM test

Part Number: TMS320F28374S

Hi Team,

  My Customer used TMS320F28374s as main controller for solar inverter, during the -25’C HBM 2KV test, customer reported that:

1)       The I/O input voltage is between -0.3V ~ -0.4V, lower than the datasheet definition;

2)       The tested the current would be 1.3A, which would overshot for the clamp current.

Could you kindly give comments for below information:

1)  For the “Absolute Maximum Ratings” definition, if the I/O input voltage lower than -0.3V or the clamp current bigger than 20mA under low temperature, how long time should be prevented? us level or ns level?

2)  How to evaluate the transient I/O overvoltage/ Overcurrent and ESD protection capability with which standard?

Expect for your reply, thanks.

Best Regards


  • Benjamin,

    The ratings in the Absolute Maximum Ratings need to be observed in all cases when the device is assembled in-system during the application and routine production line test of the device. We would never recommend applying JEDEC ESD testing in a production line test as this would be an unnecessary stress on the units and the system and careful calibration of the ESD tester equipment must be continuously maintained (I do not think you are suggesting this, but just clarifying).

    As you noted, during JEDEC defined ESD testing these maximum currents will definitely be exceeded for short durations . This is acceptable, expected, and not any concern. TI has fully qualified the device to the ESD ratings listed in the datasheet and this device does pass at the indicated JEDEC levels.

    Best regards,