Hi,
I can't clearly understand if the reporting mechanism is implemented in Z-Stack ZCL? Seems it is not.
Sample applications have a note inside the code: "See ZCL Test Applicaiton (zcl_testapp.c) for sample code on Attribute Reporting", but I can't find this "zcl_testapp.c" in Z-Stack or any references in documentation and web-site. I found a part of implementation, which should process configure reporting in esp and smartmeter samples, but it is a stub implementation. So the question is: Does TI have or plan implementation for attribute reporting, or this should be done by the developer? :-)