Part Number: SN74LV08A Tool/software: hi,
Ultrasonic microscopy result:
We engaged an external lab to look at the defective components.
Result: Ultrasonic microscopy revealed delamination.
Red color arrow – delamination
Leadframe (Abb.9) and paddle…
Part Number: SN74LV08A Tool/software: We used to order SN74LV08APW, but now the data sheet seems to indicate that the correct part number is SN74LV08APW R . Does the "R" suffix indicate RoHS, or does it indicate the large reel of devices?
This…
Part Number: SN74LV08A-Q1 Tool/software: To whom it may concern,
Do you have Junction-to-case thermal resistance(RθJC) date for SN74LV08ATPWRG4Q1 ?
It is not available on d.s.
Sincerely,
Part Number: SN74LV08A Hi,
I am using SN74LV08 in a design as follows
Kindly note that U15.PBRST is an input having internal PU of 40K to 5V rail.
Initially, 5V rail is powered, but 3.3V comes after a 10sec. delay. During this time, I am seeing a 0…
Part Number: SN74LV08A We have selected VQFN package variant of this IC for our design. This package has an exposed pad. Datasheet only states that it should be soldered to PCB for better mechanical and thermal performance. However, it does not state…
Part Number: SN74LV08A
データシートを確認したところリフローピーク温度が260℃と記載されていますがその際の加熱時間(限度値)を教えてください。
Translated to English
Heating time at reflow peak temperature
When checking the data sheet, the reflow peak temperature is stated as 260°C. What is the heating time…
Part Number: SN74LV08A-Q1 Hello Team,
Good day. My Customer wanted to know the max rated junction temperature of SN74LV08ATPWRG4Q1 device other thermal resistance value. We checked the datasheet only the junction to ambient thermal resistance is available…
Part Number: SN74LV08A Hi all
I will use SN74LV08APW in Vcc@3.3V. But the input signal attitude is 5V. In datasheet, VI(input voltage range) is 0 to 5.5V description. Does it mean the LV08A have 5V tolerant?
best regards.
Part Number: SN74LV08A Hi,
On the datasheet of SN74LV08A, there is a description of Δt/ΔV=100ns/V when Vcc=3.3V.
If this is exceeded, are there any concerns about device failure due to shoot-through current inside the device? Please let us…