This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

OPA134: INTERNAL DIE DIFFERENCE - DATE CODE 2025

Part Number: OPA134
Other Parts Discussed in Thread: OPA2134

Hi TI Team.

The purpose of this request is to ask about an internal diference that we found in MPN SN412008DRE4 , in this case we have components with 2025 date codes with impedance values very different in comparision with components with date code from 2018 as the table below , also I'm attaching our FA report for your reference. We need you support to know if during the last few years this component suffer any die change or update that is causing the below readings ?

 

SN412008DRE4 Failures - TEXAS INSTRUMENTS.pdf  

  • Hi Ramon,

    The differences you are seeing in the OPA134 can be attributed to the PCN found HERE. This PCN change is part of TI’s multiyear plan to transition products from our 150-millimeter factories to newer, more efficient manufacturing processes and technologies, underscoring our commitment to product longevity and supply continuity.

    The functional failure, also known as an in-circuit test (ICT) failure, you are currently seeing are most likely due to the updated ESD structures inside the op amp. Since the topology of the op amp has changed, the inherent resistance from the diode structure is also different. This can lead to false failures in a system level board test. Most diodes follow the same general IV curve, with a forward bias voltage around 0.7V for silicon diodes. However, all diodes vary and updating the ESD cells can change the IV curve characteristics enough to lead to the false failures you are seeing.

    Note that while the diode structure of a device can change, there is no change in the functional behavior of the device during normal operation. The protection structures are only triggered during abnormal device operation, such as an ESD event. For more information on ESD Cells in Op amps, please see this application note.

    Best regards,
    Carrie

  • Hi Ramon,

    I am going to close this thread. If you have any other questions, simply respond to the thread, and it will open back up.

    Best,
    Carrie

  • Hi Carrie.

    Yes. Go ahead and close this thread.  Thanks for your help.

  • Hi TI Team.

    One more question jump into our attention and is why on PCN# 20231219018.1 MPN #SN412008DRE4 is not referenced for the die change?  If  MPN's  OPA2134UA/2K5 & SN412008DRE4 are searched on Texas Instrument website both get directed to the same page for MPN #OPA2134UA/2K5 and is called as the same component.

    Thanks. 

  • Hi Ramon,

    Yes, the SN412008DRE4 is the same part as OPA2134UA/2K5. If you go to the OPA2134 product page, you can see that you can only order the OPA2134UA, OPA2134UA/2K5, and OPA2134PA, but that SN412008DRE4 is shown as the same orderable part as OPA2134UA/2K5. That is why it is not shown as a separate device on the PCN.

    Best regards,
    Carrie