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TAS6424E-Q1: TAS6424E test inquiry

Will Wang47
Expert 8580 points

Part Number: TAS6424E-Q1
Other Parts Discussed in Thread: TAS6424, TAS6424E

Hi team,

My customer has reported the following issue and I'd like to seek your technical input:

During electrical performance testing, with the unit powered off (GND properly connected), the customer applied a 16V power supply directly to the positive and negative output pins of the Class D amplifier and held it for 1 minute.

As a result, the Class D chip was damaged/burned out during the test.

Could you please advise on the following:

  1. Has our team previously conducted similar stress tests on the TAS6424 product?
  2. If so, what results or phenomena were observed?
  3. What are your thoughts on the root cause of this failure?

Your insights would be greatly appreciated. Thank you!

Regards,

Will

  • 0
    TI__Guru 60440 points

    Hi Will

    Will Wang47 said:
    During electrical performance testing, with the unit powered off (GND properly connected), the customer applied a 16V power supply directly to the positive and negative output pins of the Class D amplifier and held it for 1 minute.

    What is the PVDD voltage when this shortage happens? If PVDD >= 16V, there's no concern.

  • 0 in reply to Shadow He
    TI__Expert 8580 points

    Hi Shadow,

    Thanks for your feedback. PVDD get no power supply. The test is down when TAS6424E get no power supply. What's the concern here? Does it because of the diode from output to PVDD, and the voltage will get back drive to PVDD? Or any other concern here?

    Regards,

    Will

  • 0 in reply to Will Wang47
    TI__Guru 60440 points

    Hi Will

    Will Wang47 said:
    Does it because of the diode from output to PVDD, and the voltage will get back drive to PVDD?

    Yes, the voltage will charege the PVDD cap through TAS6424E's internal MOSFET parallel diode, and create damage.

    If they expect silicon itself to withstand this charging current, need to use TAS6424R version. It is specially strengthend for this test.