TAS5411-Q1: nSTANDBY is kept High while PVDD is not supplied

NOBUO FUJIHARA

Part Number: TAS5411-Q1

Hi Team,

Customer is evaluating and testing fault conditions from system point of view, and asking below question.

There is a case where PVDD is shutdown shortly while nSTANDBY is kept supplied.

In this condition, is there any concern for negative side effect or permanent damage due to possible high current flow through leakage path from nSTANDBY to device?

Best regards,

over 6 years ago

0 Gregg Scott over 6 years ago

TI__Mastermind 45085 points

Fujihara-san,

This is allowed.

0 NOBUO FUJIHARA over 6 years ago in reply to Gregg Scott

TI__Genius 9405 points

Gregg-san,

Customer also concerns from view point of MCU, whether input leakage current may increase.

Under issued condition, will nSTAND pin current be kept less than 0.2uA?

Best regards,

0 Dylan Yao over 6 years ago in reply to NOBUO FUJIHARA

TI__Genius 11080 points

Nobuo,

I need to check whether there would be a leakage path under this condition, will feedback you later.

Dylan

0 NOBUO FUJIHARA over 6 years ago in reply to Dylan Yao

TI__Genius 9405 points

Hi Dylan,

Any update on this?

Best regards,

Nobuo

0 Dylan Yao over 6 years ago in reply to NOBUO FUJIHARA

TI__Genius 11080 points

Nobuo,

I didn't get an answer yet, i will feedback you as soon as possible

Dylan

0 Dylan Yao over 6 years ago in reply to Dylan Yao

TI__Genius 11080 points

Hi Nobuo,

In the condition of PVDD shutdown while standby supplied, there is no leakage path from standby to internal VDD. So this is allowed.

Dylan

0 NOBUO FUJIHARA over 6 years ago in reply to Dylan Yao

TI__Genius 9405 points

Dylan,

Thank you so much for your support.

Best regards,

Nobuo Fujihara

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TAS5411-Q1: nSTANDBY is kept High while PVDD is not supplied