Other Parts Discussed in Thread: AFE5808A, AFE5808AEVM, AFE5808
I am using an AFE5808A Evaluation board (together with a TSW1400 data capture board). I am trying to measure figures of merit including signal to noise and distortion ratio using an external clock, but I think my measurements are currently limited by bit errors reading out the AFE5808A. The clock I am using is a sine wave at 62.5MHz and 2.825Vpp into 50Ohms. If I put the ADC into the ramp test mode, I see ramps on all 8 channels, but all channels have occasional single bit errors... usually in the 2^5 bit (error of 32). I see fewer errors if I set the external clock frequency to 31.25MHz, but the errors do not completely disappear. Do you have any idea what I'm doing wrong or how I can eliminate these bit errors?