Please advise me on how to make the correct measurement, as the measurement results using the internal voltages show different results than expected.
I have created a configuration to measure the differential voltages of AIN5 and AIN6.
In the external reference measurement, which has already been verified to be correct, the ADC readout for the differential measurement of AIN5 and AIN6 is 0xffa724 (-22748).
The following voltage conversion equation is used
Vout _ext= -22748[value] * ( ( ( 100[IMAG uA] * 2 * 0.001) * 5000[VRef mV] / 16[PGA] ) / 8388608:0x00800000[Resolution] =-0.169485[mV]
or Vout_ext = -22748[value] * ( 1000[VRef mV] / 16[PGA] ) / 8388608:0x00800000[Resolution] = -0.169485[mV]
On the other hand, the ADC readout value for the differential measurement of AIN5 and AIN6 using the internal reference was 0xffa259 (-23975). This is almost the same as the ADC readout of the external reference value.
The following voltage conversion equation was used
Vout_int=-0.365829[mV] = -23975[value] * ( 2048[VRef mV] / 16[PGA] ) / 8388608:0x00800000[Resolution])
I think this is a strange result, since the weights per LSB are 2.048 times different, so the ADC readout should be 2.048 times different.
Furthermore, after conversion to voltage, the values should be almost the same.
Can you please tell me why this is the case?
I am not sure what the cause is, but it seems that the internal reference mode is not enabled.
Is it because we are using the wrong register settings or system configuration?
Here are the settings when measuring using the external REF
Translated with www.DeepL.com/Translator (free version)
The settings for measurement using the internal REF are as follows
The system configuration of ADS1248 and measuring resistors is shown in the figure below.