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Original question:

ADS1278-SP: ADS1278-SP - SEE testing

ADS1278-SP: SET testing and likelihood of SEFI

Vicki Cripps
Prodigy 10 points
Part Number: ADS1278-SP

Hi,

We have selected the ADS1278-SP for use on an ESA mission. The contractor who has performed the radiation analysis for our unit has flagged the possibility of a Single Event Functional Interrupt (SEFI) as a result of a SET. They refer to the paper "Radiation Evaluation of the ADS1278-SP Radiation Hardened 24-Bit 8-Ch Simultaneous-Sampling ADC" highlighted in an earlier related thread. They recommend SEFI testing, which is obviously very expensive and time consuming.

1) Is this SET test still relevant? Why is this paper not on the TI website?

2) Do TI consider it possible/likely that a SET or other single event would lead to a SEFI?

3) If yes, how would a SEFI manifest itself (go into an unknown state?) and what would be the recommended recovery action (power cycle?) ?

Many thanks,

Vicki

  • 0
    TI__Mastermind 25020 points

    Hello Vicki, 

    Can you share the report that the contractor referred to? I suspect it is not online, anymore, because we have updated information and reflected this online. Note there is a "Single-Event Effects Test Report" for the device available on the product folder, dated 2018. If the report they are referring to is older and has different data, they should discard that and refer to the report available online. I would also encourage them to check the product folder technical documentation section  for any other relevant information 

    Due to the holidays, we are low on staff and will need to wait until their return to address your follow up questions.  I would suggest taking a look at the documentation available in hopes it can address any further questions in the mean time. 

    Regards

    Cynthia 

  • 0
    Prodigy 10 points

    Hi Cynthia,

    The report 'Radiation Evaluation of the ADS1278-SP Radiation Hardened 24-Bit 8-Ch Simultaneous-Sampling ADC' is available on the IEEE website: https://ieeexplore.ieee.org/document/8906602

    It is from the 2019 IEEE Radiation Effects Data Workshop and the authors are from TI.

    This report is not available on the TI website as far as I can find. We have seen the SEE test report you highlighted, thank you.

    Kind regards,

    Vicki