Hi,
Regarding device tmcs1123, could you please help clarify the following points?
-
What is the material used for the Hall element?
-
When used long-term, which behavior best represents the characteristic change of the Hall element?
-
Pattern 1: Gradual change over time
-
Pattern 2: Sudden change after certain operation time
-
-
If the Hall element characteristics shift, are the main affected parameters “current sensitivity,” “zero-current voltage,” and “linearity”?
-
For galvanic isolation, is it achieved solely by mold resin, or is there an internal insulating material such as polyimide tape?
-
Please provide the dielectric thickness (DTI).
-
If insulation is based on mold resin, do you have test results for withstand voltage degradation under high-humidity conditions?
-
For insulation lifetime evaluation, I assume accelerated tests with high voltage are performed. How do you determine whether failures are due to wear-out mechanisms?
Thanks,
Conor