Part Number: ADC128S102-SEP
Hi Team,
Posting on behalf of our customer.
I'll share this E2E post with our customer so he can reply when needed.
The datasheet for the ADC128S102-SEP states:
7.3.4.1 Total Ionizing Dose Testing and qualification of these products is done on a wafer level according to MIL-STD-883G, Test Method 1019.7. Testing is done according to condition A and the extended room temperature anneal test described in section 3.11 for application environment dose rates less than 51.61 rad(Si)/s. Wafer level TID data are available with lot shipments.
7.3.4.2 Single Event Latch-Up
One-time single event latch-up (SEL) was preformed according to EIA/JEDEC Standard, EIA/JEDEC57. The linear energy transfer threshold (LETth) shown in the Features section is the maximum LET tested. A test report is available upon request.
Please share example of wafer level TID data for an example lot as well as the SEL test report.
Regards,
Danilo
