Hello,
I am using the eval boards from TI for DAC3484 with TSW1400. I configured the TSW1400 to be in JTAG mode by changing the resistors, so that I can do some development. I did the JTAG mostly to look at the signals on signal tap
coming to the questions, I have
1.When I connected the boards yesterday, for some reason the temperature sensor was reading 127 all the time. I touched the chip and it wasn't that hot. I am not sure what happened there. This morning I disconnected everything and connected them back and it is reading 33 deg C. My question is how do I know, if DAC3484 got damaged or not, if it was true 127 deg C. I am not sure how to do the same test that is explained in the evm testing procedure as I modified the TSW1400 board
2. Another question is, I just want to make sure I am heading in the right direction with the design parameters
I would like to generate 4x56 MHz signals at the output with no interpolation. I am using 112 MHz DDR for the DATACLK and 56 MHz for DACCLK.
If these setting are right, I am having issues with generating OSTR signal, which will be DACCLK/8 as there is no interpolation. This is more of a limitation from the CDCE62005. Is there a simpler way to handle the FIFO? I have read through the data sheet and the question is what happens, if I bypass the FIFO or use the same signal for read and write FIFO (like SYNC or FRAME). I understand there could be some timing issues, if it is done that way.
Thanks,
Ramakrishna