This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

ADC12D1000: Test pattern in non-demux mode

Part Number: ADC12D1000

Hi,

I'm wondering whether the test pattern shown in table 3 of the adc12d1000 datasheet for the non-demux mode is correct.
Indeed I'm trying to synchronize my FPGA with the ADC operated at 1GHz (DCLK frequency hence is 1/2*fadc=500MHz) and I observe the following sequence for the I bus :
T0 : 004h
T1 : 004h
T2 : FFBh
T3 : FFBh
T4 : 004h
T5 : 004h
T6 : FFBh
T7 : FFBh
T8 : 004h
T9 : 004h

I'm sure that the data are sampled correctly at the FPGA input, because I perform a data phase alignment.
And I can guarantee that the data are sampled in the middle of the window.

Moreover if I compare the data I'm observing with the pattern shown in table 2 for the demux mode for the Id output,
it seems consistent with what I observe considering each sample is recorded twice.
I assume the pattern generator is located before the 1:2 demuxer, and that it is merely the same.
Thus it would make sense to see each sample of table 2 twice in the stream if the demux is not activated.

Can you confirm my observation, and if true correct the datasheet?

Thanks in advance, best regards

  • Hi Christophe

    Can you provide the capture results in test pattern for at least 24 samples?

    I believe the pattern description in the datasheet is correct for both Demux and Non-Demux modes, but will double check.

    Best regards,

    Jim B

  • Hi Jim,

    Here is the captured test pattern in Non-Demux mode for I and Q (first and second column) :

    4	0
    4	0
    4	ffff
    4	ffff
    fffb	0
    fffb	0
    4	ffff
    4	ffff
    fffb	0
    fffb	0
    4	0
    4	0
    4	ffff
    4	ffff
    fffb	0
    fffb	0
    4	ffff
    4	ffff
    fffb	0
    fffb	0
    4	0
    4	0
    4	ffff
    4	ffff
    fffb	0
    fffb	0
    4	ffff
    4	ffff
    fffb	0
    fffb	0
    4	0
    4	0
    4	ffff
    4	ffff

    Best regards,
    Christophe
  • Thanks Christophe

    I'll try to gather some comparative data tomorrow to verify what should be happening.

    Best regards,

    Jim B

  • Hi Christophe

    I've verified that the non-demux test patterns for I and Q data outputs do agree with the datasheet Table.

    Using the EVM it wasn't easy to get the data for I and Q simultaneously, but I was able to confirm each pattern is correct.

    Here are my results. I captured using the ADC12D1XXXXRB platform which always captures assuming 1:2 demux mode. So every second data point is garbage due to the un-driven FPGA input channel.

    ADC TPM captured in nondemux mode ADC12D1800RFRB.xlsx

    Please look again at the configuration of your capture/clocking/storage etc. to find what can be causing issues.

    Another check is to put a low frequency sine wave into the ADC. That can also help point toward what samples might be out of order, missing, duplicated, etc.

    Best regards,

    Jim B

  • Hi Jim,

    Indeed we confirm that there is an issue on our side. We made another diagnostic by measuring the output signal with an oscillocope. For that we found a method to dramatically decrease the ADC sampling clock on our board. We went from 1GHz to 100 MHz (bit time of 10 ns) and we recorded DQ9_P and ORQ_P (see below) and they confirm that the datasheet is correct.

    Thanks for your help.

    Best regards

    Olivier B.

    DQ9_P capture

    ORQ_P capture

  • Hi Olivier
    Thanks for the update.
    Since you have confirmed the proper pattern at lower speed I am going to close this discussion thread.
    Please post a new thread if you have any questions on other topics.
    Best regards,
    Jim B