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ADS1115-Q1: On the difference between AEC-Q100 adaptive products and non-adaptive products

Noritomo Harukawa
Intellectual 990 points
Part Number: ADS1115-Q1
Other Parts Discussed in Thread: ADS1115

I confirmed the AEC-Q100 adaptation of ADS1115-Q1 at E2E below.


In this E2E, I got the answer that ADS1115BQDGSRQ1 is adapted to AEC-Q100.

From this answer I understood as follows.

　a)ADS1115BQDGSRQ1(AEC-Q 100 adaptation)
　b)ADS1115QDGSRQ1(AEC-Q100 non-adaptation)

Q.
What is the difference between ADS1115BQDGSRQ1 and ADS1115QDGSRQ1?
I think that the difference is the reason for adapting to AEC-Q100.

-Harukawa

  • 0
    TI__Guru* 97465 points

    Harukawa-san,


    That is correct. The two devices should electrically be the same. However, the ADS1115QDGSRQ1 did not go through the full AEC-Q100 tests. The ADS1115BQDGSRQ1 did complete the qualification.

    Joseph Wu

  • 0 in reply to Joseph Wu
    Intellectual 990 points

    Thank you for your reply.

    > The two devices should electrically be the same.
    > However, the ADS1115QDGSRQ1 did not go through the full AEC-Q100 tests.
    > The ADS1115BQDGSRQ1 did complete the qualification.

    I understand the test items of AEC-Q100 as follows.

    ・AEC-Q100 Environmental Stress Test
    ・AEC-Q100 Accelerated Life Tests
    ・AEC-Q100 Package Assembly Integrity Tests
    ・AEC-Q100 Die-Level Reliability Tests
    ・AEC-Q100 Electrical Characteristics Assessment
    　　- AEC-Q100-002 : Human body model electrostatic discharge test
    　　 AEC-Q100-003 : Electrostatic discharge(esd) sensitivity testing machine model
    　　- AEC-Q100-011 : Charged device model electrostatic discharge test
    　　- AEC-Q100-004 : Latch-up
    　　- AEC-Q100-009 : Electrical distribution assessment
    　　- AEC-Q100-006 : Gate leakage
    ・AEC-Q100 Cavity Package Test (Ceramic Package)

    I think that ADS1115QDGSRQ1 did not pass AEC-Q100 Electrical Characteristics Assessment.

    Q.
    ADS1115BQDGSRQ1 passed the AEC-Q100 Electrical Characteristics Assessment, but what changed?
    For example,
    　1)Material has changed.
    　2)All layer was changed.
    etc..

    Please provide if you have any information.

    -Harukawa

  • 0 in reply to Noritomo Harukawa
    TI__Guru* 97465 points
    Harukawa-san,


    I'm not sure of the exact differences between the devices, so I'll need to check. Please give me some time to gather the information.


    Joseph Wu
  • 0 in reply to Joseph Wu
    Intellectual 990 points

    Thank you for your help. Your support is greatly appreciated.

    -Harukawa

  • 0 in reply to Noritomo Harukawa
    TI__Guru* 97465 points
    Harukawa-san,


    After asking a few questions, my understanding is that the ADS1115QDGSRQ1 was not tested for all AEC-Q100 tests. In addition, the ADS1115QDGSRQ1 was originally done with a fab that could not support large volume manufacturing because of capacity.

    To support high volumes, the fab and manufacturing (which may include material and layers) were changed to a different sites with the ADS1115BQDGSRQ1. This required a completely new qualification (instead of re-qualifying with the ADS1115QDGSRQ1).

    Again, for new developments, we recommend the ADS1115BQDGSRQ1 which should be fully AEC-Q100 compliant.


    Joseph Wu