AFE4300: AFE4300 design verification

Hi Amol,

Can you share in this forum?

Regards,
Prabin

Hi Prabin,

I can't share it on public forum

Regards,

Amol 

Hi Amol,

You can send me the files.

Regards,
Prabin

how?

Dear Sir,

please find the details for the same

Regards,

Amol

Hi Amol,

Few comments:
1) Instead of 10MOhm, can you place 10KOhm in between IOUTs.
2) Caps at the input pins of weight scale ( such as C8, C10 and C11) can be made "Do Not Install (DNI)" by default.
3) Also the pull up resistor on ADC_RDY should be DNI.

Regards,
Prabin

Hi prabin,
thanks for reply

currently i am not exploring the weight scale part but whether making the changes as per point 1 and 3 resolve my issue related to fluctuated readings measured at external dummy resistor of 1K resistor

Regards,
Amol

Hi Amol,

How much is the fluctuations and is it in FWR or IQ mode?
Also are you doing calibration?

Regards,
Prabin

Hi Prabin,

We are using it in FWR mode
even we are getting the fluctuating ADC values for BCM measurement (21930 & 43945) when we connected dummy 1K resistor between IOUT1 & IOUT0

No we are not doing calibration, if we get stable output within range then we can go for calibration
the main concern is reading fluctuations!

Regards,
Amol

Hi Amol,

Can you please measure the voltage across OUTP_I_FILT and OUTM_I_FILT pins?

Regards,
Prabin

Hi,
what are the expected voltages for the same?

Regards,
Amol

Dear Sir,

I have interfaced the TI eval board with our micro-controller board, even now getting the same results
for 1K value we are getting 0.004V across capacitor C17 in eval board (where as calculated value is 0.35V)

kindly suggest the further action

Regards,
Amol

Hi Amol,

Few things to try to debug this issue.
1) Measure the differential voltage right across VSENSE pins.
2) Check whether the voltage scales linearly with different impedance ( e.g 200ohms, 5000 ohms).

Regards,
Prabin