Other Parts Discussed in Thread: , LM95233
In note 1 on page 4 of the ADC12DJ2700 datasheet, it says that:
"Powering down the high-speed data outputs (DA0± ... DA7±, DB0± ... DB7±) for extended times may reduce performance of the output
serializers, especially at high data rates"
It is hard to know if this means that one second or a year is the limit at which one risks (say 0.1% chance) a noticeable degradation. Can you clarify the times involved?
Also, it would be interesting to know what the mechanism of the degradation is. Since the part is partially powered down, I doubt it is electromigration. Is it breakdown of thin gate oxides?