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DAC8750: Definition about TUE in the datasheet

Part Number: DAC8750

Hi team,

We would like to understand the definition of TUE in DAC8750 datasheet.

1. Does TUE specification include INL, Offset Error and Gain Error?
    We are confused this because the datasheet has TUE and also INL, Offset Error and Gain Error. 

2. There are two case of TUE in DAC8750 datasheet, (0 mA TO 20 mA AND 0 mA TO 24 mA) and (4 mA TO 20 mA).
In case of (0 mA TO 20 mA AND 0 mA TO 24 mA), does this include internal Rset error?

In case of (4 mA TO 20 mA), there are two case specification, Internal Rset or External Rset in the datasheet. What is test condition of these resisters? 
I understand these errors would affect TUE.

Regards,

Noriyuki Takahashi 

  • Hi Takahashi-san,

    1. Yes, the TUE is the total error and is measured over the code range (per code). The gain error and offset error are measured by a best-fit line between two points in the middle of the curve. INL is then measured by removing the gain and offset error to see the 'true' non-linearity that cannot be compensated for by calibration.

    2. Yes, where specified as internal Rset it is including the internal Rset error. When TUE is specified for external Rset, an external resistor is used and contributes error.

    The TUE is simply measured using the internal Rset and again using an external Rset. If I remember correctly a 0.005% 2ppm resistor was used as external Rset for the TUE measurement.

    Thanks,
    Garrett