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ADS1274: Chip failure Root Cause Analysis

Part Number: ADS1274


One of our contractors created their own board design, using the ADS1274, and identified not faults in lab testing, HAULT, ESS, or EQT. Upon first article testing we began seeing high failure rates characterized by no DIO output from the ADC. Failure analysis began looking for changes in channel behavior and found Analog CH 1 no longer produced an output at DIO, though remaining CH 2, 3, and 4 were still operable. No identifiable signs of burning seen on the board, though we believe the chips still suffered damage from either the Analog Input, power, ground, or clock pins. We are considering delamination to  check for tansistor breakdown, but I'm curious if anyone else has seen this or has an idea what could cause such damage. - Brian Jaeger

  • Hello Brian,

    Welcome to our forum and thank you for your post!

    This issue has come up in the past. Almost always, it seems to be caused by a ground potential difference that develops between AGND and DGND. The Absolute Maximum Rating is only +/-300 mV on this device. Depending on where the two grounds are tied together in relation to the ADC, any transient on the ground plane could possibly cause the difference between them to exceed this limit.

    Please refer to the following post, which discusses how one customer was able to resolve this issue:

    Best Regards,