Hi,
I'm currently writing firmware to interface this device to an FPGA in 10 bit mode. At the minute I can read full scale ramp test pattern data into the FPGA from the ADC. However, It seems I have work to do to get the data through my SERDES into the FPGA fabric in the correct order. From the data that I receive from the ADC, it looks like the full scale ramp test pattern data increments in counts of four. There could be many reasons for this on my side of the design but first I would like to be sure of exactly how the full scale ramp test pattern data is output. So my question is...
Does anyone know for sure what the value of the incremental count of the full scale ramp test pattern should be when the ADC is configured for 10 bit mode?
For 12 bit mode I can see from the user manual (slau537 , pg27, fig.35) that the full scale ramp test pattern should increment in steps of 1. There seems to be no information provided for 10 bit mode.
Thanks in advance,
Niall