Hi,
I would like to have some verification:
In the datasheet revision SLAS605C, chapter 9.2 typical applications.
Several graphs are given for the throughput rate versus Source resistance.
How is the throughput rate lowered during these tests? By lowering the clock frequency? And/or extending the acquisition phase?
I assume in the unbuffered situation, the acquisition time is the main contributor.
But in the buffered MXO, the analog IP settling becomes the main contributor.
Is my assumption correct?
In our case we have an throughput rate of 80ksps. But with a 20MHz clock during settling time and 325ns acquisition time.
According to the datasheet graphs you can go to 10kOhm, but think (almost know for sure) that is not valid in our case.
Regards, Hans